Used FEI Verios 460L field emission ultra-high resolution scanning electron microscope (SEM) with Oxford X-Max N50 EDS system for elemental analysis. System is currently fully functional and available for demonstration by appointment. SEM, EDS controller boxes included. Spicer SC24 field cancellation unit included.
The column is almost completely rebuilt with a new FEG, upper column, pole tip, power supplies installed as of Fall 2022. Equipped with ETD, TLD, MD, ICD, CBS, STEM3+ detectors. System has a load lock, biasing stage, landing energy 20eV to 30keV, magnification 45x to 1Mx, WD=0.5mm to 20mm, and piezo stage movement in X,Y,Z, R, T. Upper corrector (monochromator) plus 0–4 kV sample bias.
0.6 nm resolution from 2–30 kV. 0.7 nm at 1 kV and 1 nm at 500 eV. Landing energies from 20 eV to 30 keV using the integrated stage bias.
Water chiller not included.
We can provide disassembly, shipping, and reinstallation for an additional cost.
System located in Orlando, FL.
